> ## Documentation Index
> Fetch the complete documentation index at: https://docs.atomscale.ai/llms.txt
> Use this file to discover all available pages before exploring further.

# Characterization Overview

> Automated analysis workflows for thin film characterization techniques

Atomscale provides automated analysis workflows for common thin film characterization techniques. Each workflow processes raw instrument data to extract metrics, identify features, and generate actionable insights.

## In-Situ Techniques

Analysis workflows for instruments operating during thin film growth.

<CardGroup cols={2}>
  <Card title="RHEED" icon="wave-square" href="/platform/characterization/rheed">
    Surface structure analysis from diffraction patterns and intensity oscillations.
  </Card>

  <Card title="Ellipsometry" icon="sun" href="/platform/characterization/ellipsometry">
    Timeseries extraction from spectroscopic ellipsometry measurements.
  </Card>

  <Card title="Optical Images" icon="video" href="/platform/characterization/optical-images">
    Video segmentation and morphology tracking from optical microscopy.
  </Card>
</CardGroup>

## Ex-Situ Techniques

Analysis workflows for post-growth characterization instruments.

<CardGroup cols={2}>
  <Card title="XPS" icon="atom" href="/platform/characterization/xps">
    Elemental composition analysis from X-ray photoelectron spectroscopy survey spectra.
  </Card>

  <Card title="SEM" icon="microscope" href="/platform/characterization/sem">
    Object segmentation and morphological analysis from electron micrographs.
  </Card>

  <Card title="Photoluminescence" icon="lightbulb" href="/platform/characterization/photoluminescence">
    Spectral analysis of photoluminescence emission measurements.
  </Card>

  <Card title="Raman" icon="wave-sine" href="/platform/characterization/raman">
    Vibrational spectroscopy for material composition and crystal quality.
  </Card>

  <Card title="SIMS" icon="layer-group" href="/platform/characterization/sims">
    Depth profiling of elemental composition from secondary ion mass spectrometry.
  </Card>
</CardGroup>

## Common Capabilities

All characterization workflows share these features:

| Feature              | Description                                                              |
| -------------------- | ------------------------------------------------------------------------ |
| Automated processing | Workflows run automatically when data arrives from connected instruments |
| Metric extraction    | Key measurements extracted and stored for trending and comparison        |
| Batch processing     | Process historical datasets through the same analysis pipelines          |
| SDK access           | Retrieve results programmatically via the Python SDK                     |
| Export               | Download results in CSV, JSON, or custom formats                         |

## Getting Started

<Steps>
  <Step title="Connect your instrument">
    Add your instrument as a data source under **Settings > Data Sources**. See [Connect](/platform/get-started/connect) for details.
  </Step>

  <Step title="Enable the workflow">
    Navigate to the relevant technique page and follow the Setup tab instructions to enable and configure the workflow.
  </Step>

  <Step title="Configure alerts">
    Set up alerts for metrics that matter to your process. Each technique page documents available alert options.
  </Step>

  <Step title="Verify outputs">
    Run a test analysis and confirm outputs match expectations before relying on the workflow in production.
  </Step>
</Steps>

## Related Documentation

<CardGroup cols={2}>
  <Card title="Detect Anomalies During a Run" icon="bell" href="/platform/guides/detect-anomalies">
    Use characterization alerts as part of real-time monitoring.
  </Card>

  <Card title="Python SDK" icon="python" href="/sdk">
    Access analysis results programmatically and build custom pipelines.
  </Card>
</CardGroup>