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GET
Returns processed X-ray diffraction (XRD) data, including the diffraction pattern (intensity versus 2θ) and any detected peaks.
string
required
The data entry UUID for the XRD measurement

Response

string
Data entry UUID
string
XRD results identifier
array
Diffraction angle (2θ) values
string
Unit for the two_theta values (e.g., degrees)
array
Intensity/count values corresponding to each two_theta value
number
X-ray source wavelength in angstroms
array
Detected peaks in the diffraction pattern
object
Additional metadata about the measurement
string
ISO 8601 timestamp of last update