In-Situ Techniques
Analysis workflows for instruments operating during thin film growth.RHEED
Surface structure analysis from diffraction patterns and intensity oscillations.
Ellipsometry
Timeseries extraction from spectroscopic ellipsometry measurements.
Optical Images
Video segmentation and morphology tracking from optical microscopy.
Ex-Situ Techniques
Analysis workflows for post-growth characterization instruments.XPS
Elemental composition analysis from X-ray photoelectron spectroscopy survey spectra.
SEM
Object segmentation and morphological analysis from electron micrographs.
Photoluminescence
Spectral analysis of photoluminescence emission measurements.
Raman
Vibrational spectroscopy for material composition and crystal quality.
SIMS
Depth profiling of elemental composition from secondary ion mass spectrometry.
Common Capabilities
All characterization workflows share these features:| Feature | Description |
|---|---|
| Automated processing | Workflows run automatically when data arrives from connected instruments |
| Metric extraction | Key measurements extracted and stored for trending and comparison |
| Batch processing | Process historical datasets through the same analysis pipelines |
| SDK access | Retrieve results programmatically via the Python SDK |
| Export | Download results in CSV, JSON, or custom formats |
Getting Started
Connect your instrument
Add your instrument as a data source under Settings > Data Sources. See Connect for details.
Enable the workflow
Navigate to the relevant technique page and follow the Setup tab instructions to enable and configure the workflow.
Configure alerts
Set up alerts for metrics that matter to your process. Each technique page documents available alert options.
Related Documentation
Detect Anomalies During a Run
Use characterization alerts as part of real-time monitoring.
Python SDK
Access analysis results programmatically and build custom pipelines.