In-Situ Techniques
Analysis workflows for instruments operating during thin film growth.RHEED
Surface structure analysis from diffraction patterns and intensity oscillations.
Ellipsometry
Timeseries extraction from spectroscopic ellipsometry measurements.
Optical Images
Video segmentation and morphology tracking from optical microscopy.
Ex-Situ Techniques
Analysis workflows for post-growth characterization instruments.XPS
Elemental composition analysis from X-ray photoelectron spectroscopy survey spectra.
SEM
Object segmentation and morphological analysis from electron micrographs.
Photoluminescence
Spectral analysis of photoluminescence emission measurements.
Raman
Vibrational spectroscopy for material composition and crystal quality.
SIMS
Depth profiling of elemental composition from secondary ion mass spectrometry.
Common Capabilities
All characterization workflows share these features:Getting Started
1
Bring in your data
Upload files with Add Data, start a live session from Monitor > Monitor New Growth, or connect instruments through the desktop app integrations. See Connect for details.
2
Adjust analysis settings
Analysis runs automatically when data arrives. To change settings for a data item, open its Configuration drawer (for techniques that have one), or use Actions > Reanalyze to re-run analysis.
3
Investigate the results
Use an analysis notebook to investigate an engineering question. See Investigate an Unexpected Change for an example.
4
Verify outputs
Run a test analysis and confirm outputs match expectations before relying on the workflow in production.
Related Documentation
Investigate an Unexpected Change
Examine a change and evaluate possible explanations with the available data.
Python SDK
Access analysis results programmatically and build custom pipelines.