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Workflows are the analysis pipelines that Atomscale runs on your data. Each workflow processes raw instrument data through a sequence of steps to extract metrics, detect patterns, or produce derived outputs. They run automatically when data arrives and store their results for visualization, comparison, and export.

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Characterization Workflows

Each characterization method on the platform is a workflow. When you upload or stream data from an instrument, the corresponding characterization workflow runs automatically to extract metrics and features specific to that technique.

RHEED

Surface structure analysis from diffraction patterns and intensity oscillations.

XPS

Elemental composition from photoelectron spectra.

Ellipsometry

Optical property timeseries from spectroscopic ellipsometry.

Optical Images

Video segmentation and morphology tracking.

SEM

Particle segmentation and morphological analysis.

Photoluminescence

Spectral analysis of photoluminescence emission.

Raman

Vibrational spectroscopy for material composition.

SIMS

Depth profiling of elemental composition.
See the Characterization overview for details on each technique.

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Cross-Cutting Workflows

These workflows operate across characterization data to provide additional analysis.

Similarity

Embed characterization timeseries into 2D for visual comparison, and track similarity to reference items over time.

Anomaly Detection

Detect anomalies via embedding-based outlier detection, cross-source correlation, and predictive forecasting.

Tool State

Parse, clean, and analyze instrument log files from synthesis tools.